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    Suzhou Electric Appliance Research Institute
    期刊號(hào): CN32-1800/TM| ISSN1007-3175

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    基于樸素貝葉斯算法的避雷器缺陷識(shí)別方法研究

    來源:電工電氣發(fā)布時(shí)間:2022-01-20 13:20 瀏覽次數(shù):535

    基于樸素貝葉斯算法的避雷器缺陷識(shí)別方法研究

    李亞錦1,劉英男1,張婉瑩1,于大洋1,張國新1,蘇寧2
    (1 山東大學(xué) 電氣工程學(xué)院,山東 濟(jì)南 250061;
    2 海南電網(wǎng)有限責(zé)任公司瓊海供電局,海南 瓊海 571400)
     
        摘 要:高溫、高濕、高鹽特殊環(huán)境下,加速了避雷器劣化或潛伏性缺陷的發(fā)展。僅依靠避雷器監(jiān)測(cè)指標(biāo)判斷缺陷,難以識(shí)別特殊環(huán)境下避雷器的異常狀態(tài)。提出一種基于樸素貝葉斯算法的避雷器缺陷識(shí)別技術(shù),提取特殊環(huán)境下影響避雷器運(yùn)行狀態(tài)的關(guān)鍵特征量,通過樸素貝葉斯算法計(jì)算訓(xùn)練樣本的先驗(yàn)概率和測(cè)試樣本的后驗(yàn)概率,從而識(shí)別避雷器缺陷類型。利用實(shí)際監(jiān)測(cè)和檢測(cè)數(shù)據(jù)進(jìn)行分析,驗(yàn)證了所提方法的可行性和正確性。
        關(guān)鍵詞:樸素貝葉斯算法;特殊環(huán)境;帶電檢測(cè);避雷器;缺陷識(shí)別
        中圖分類號(hào):TM862     文獻(xiàn)標(biāo)識(shí)碼:A     文章編號(hào):1007-3175(2022)01-0020-04
     
    Research on Classification of Arrester Defect Diagnosis Based on Naive
    Bayes Algorithm Inference
     
    LI Ya-jin1, LIU Ying-nan1, ZHANG Wan-ying1, YU Da-yang1, ZHANG Guo-xin1, SU Ning2
    (1 School of Electrical Engineering, Shandong University, Jinan 250061, China;
    2 Qionghai Power Supply Bureau of Hainan Electric Power Co., Ltd, Qionghai 571400, China)
     
        Abstract: The special environment of high temperature, high humidity, and high salt could accelerate the development of the deterioration or latent defects of the arrester.It is difficult to identify the abnormal state of the arrester in the special environment just relying on the monitoring index of the arrester.This paper proposed arrester defect diagnosis technology based on Naive Bayes, which extracted the key features that affect the operation state of the arrester in a special environment. It calculated the prior probability of training samples and the posterior probability of test samples through a Naive Bayes algorithm to identify the type of arrester defects. The feasibility and correctness of the proposed method are analyzed and it verified by the actual monitoring and detection data.
        Key words: Naive Bayes algorithm; special environment; live detection; arrester; defect diagnosis
     
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