Cognex表面檢測(cè)系統(tǒng)在硅鋼酸軋線中的改造應(yīng)用
張國(guó)忠,林育茲,劉永春
(廈門大學(xué)嘉庚學(xué)院 機(jī)電工程系,福建 廈門 361000)
摘 要:介紹了Cognex 表面檢測(cè)系統(tǒng)的基本原理、構(gòu)成和在硅鋼酸軋線中的應(yīng)用情況。對(duì)其在運(yùn)行過(guò)程中出現(xiàn)的四類問(wèn)題加以分析說(shuō)明,并從中找到合適的解決方案對(duì)其進(jìn)行了改造。結(jié)果表明:該改造方案能夠使檢測(cè)光源亮度波形明顯好轉(zhuǎn),降低了設(shè)備維護(hù)難度及減少了機(jī)組停機(jī)時(shí)間,保證了鋼帶產(chǎn)品的生產(chǎn)質(zhì)量。
關(guān)鍵詞:表面缺陷;缺陷檢測(cè);光源;攝像機(jī);編碼器
中圖分類號(hào):TM701.3 文獻(xiàn)標(biāo)識(shí)碼:B 文章編號(hào):1007-3175(2016)07-0038-03
Transform and Application of Cognex Surface Detection
System for PL-TCM of Silicon Factor
ZHANG Guo-zhong, LIN Yu-zi, LIU Yong-chun
(Department of Mechanical and Electrical Engineering, Xiamen University Tan Kee College, Xiameng 361000, China)
Abstract: Introduction was made to the fundamental principle, composition of Cognex surface detection system for the PL-TCM of Silicon, this paper analyzed various problems and failures arising in the operational process and found out the right solution to tackle the problems of their transformation. The results show that the modification scheme could make the detection light source luminance waveform come a long way and reduce the difficulty of equipment maintenance and the time of unit machine halt, which guarantees the production quality of steel belt.
Key words: surface defect; defect detection; light source; vidicon; encoder
參考文獻(xiàn)
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